Integrated yields
From GOSIA
(added link to new 4pi array page) |
(separated p-gamma event calculation into a new subsection) |
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After an integration, the cross section in mb is obtained by multiplying the yield by | After an integration, the cross section in mb is obtained by multiplying the yield by | ||
| - | the Ge solid angle in <math>sr</math> and dividing by the target thickness in <math>mg/cm^2</math>. | + | the Ge solid angle in <math>sr</math> and dividing by the target thickness in <math>mg/cm^2</math>. |
| - | + | ||
| - | Detected p-gamma coincident events | + | ===Detected p-gamma coincident events=== |
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| + | The absolute p-gamma counts expected can be calculated using the equation following equation 6.44b in the manual: | ||
<math>N_i = 10^{-30} [Q / qe] [N_A / A] Y(I_i-->I_f) \epsilon_p \epsilon_\gamma \Delta \Omega_\gamma</math>, (1) | <math>N_i = 10^{-30} [Q / qe] [N_A / A] Y(I_i-->I_f) \epsilon_p \epsilon_\gamma \Delta \Omega_\gamma</math>, (1) | ||
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where <math>Q</math> is the integrated beam current incident on the target during the experiment, <math>q</math> is the average charge state of the beam, <math>e</math> is the electron charge, | where <math>Q</math> is the integrated beam current incident on the target during the experiment, <math>q</math> is the average charge state of the beam, <math>e</math> is the electron charge, | ||
| - | If the absolute efficiency is known well, then it is possible to | + | If the absolute efficiency is known well, then it is possible to reproduce |
the actual counts measured in the photopeak by putting the efficiency into this | the actual counts measured in the photopeak by putting the efficiency into this | ||
equation. | equation. | ||
